Advantest Deploys Adaptive ACS Probe Cleaning to Optimize Probe Board Cleaning Efficiency
Although there are many techniques aimed at reducing the time and cost of testing, the cost of probe cards presents an emerging challenge as pin count and functional complexity increase, as does the expense ratio of probe cards. in maintenance and life cycle management. Typically, chipmakers implement a fixed-cycle inline cleaning method, which requires a learning curve to determine the ideal trade-off between cleaning and yield loss and therefore takes longer in the new ramps up devices and causes more losses than necessary.
ACS APC introduces Advantest’s ‘Adaptive Interval’ approach to probe tip cleaning. It uses artificial intelligence (AI) algorithms to assess how dirty the needles are and only cleans them when yields are affected to significantly reduce cleaning frequency. The machine learning model takes the test result of the first wafer with a prefixed cleaning cycle to learn the failure pattern, then it switches to adaptive cleaning for the rest of the wafers in the same batch. Evaluation takes negligible time per wafer, with no impact on test throughput.
“Our new APC solution demonstrates Advantest’s Grand Design commitment to adding customer value in the evolving semiconductor value chain,” said Titan Chang, Managing Director,
The new Advantest ACS Adaptive Probe Cleaning solution works with all existing ATE platforms and wafer testers and does not require program modifications or the use of specific parametric data. Proven to work seamlessly in combination with dual probe card cleaning sheets at different cleaning frequencies.
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